5767 - 半導體元件分析技術 英授 Taught in English
Analysis Technologies for Semiconductor Devices
教育目標 Course Target
1.Introduction of IC
2.Introduction of failure analysis
3.Introduction of material analysis
4.Introduction of various analysis techniques
1.Introduction of IC
2.Introduction of failure analysis
3.Introduction of material analysis
4.Introduction of various analysis techniques
課程概述 Course Description
This course introduces a range of analysis techniques for semiconductor devices, with a particular emphasis on Integrated Circuits (ICs). It begins with an overview of semiconductor devices, followed by a focus on failure analysis and material analysis. The course then covers various additional analysis techniques relevant to semiconductor applications.
This course introduces a range of analysis techniques for semiconductor devices, with a particular emphasis on Integrated Circuits (ICs). It begins with an overview of semiconductor devices, followed by a focus on failure analysis and material analysis. The course then covers various additional analysis techniques relevant to semiconductor applications.
參考書目 Reference Books
自編教材
Self-edited teaching materials
評分方式 Grading
| 評分項目 Grading Method |
配分比例 Percentage |
說明 Description |
|---|---|---|
|
出席率 Attendance |
15 | |
|
作業 Homework |
20 | |
|
期中考 midterm exam |
30 | |
|
期末考 final exam |
30 | |
|
心得報告 Experience report |
5 |
授課大綱 Course Plan
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相似課程 Related Courses
無相似課程 No related courses found
課程資訊 Course Information
基本資料 Basic Information
- 課程代碼 Course Code: 5767
- 學分 Credit: 0-3
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上課時間 Course Time:Tuesday/6,7,8
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授課教師 Teacher:劉志毅
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修課班級 Class:電機系3,4,碩1,2
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選課備註 Memo:英文授課
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