The purpose of this course is to introduce a series of material analysis methods to students. The content of this course includes surface analysis techniques, X-ray diffraction methods, thermal analysis tools, chromatography, and analytical electron microscopes.
1. Structure of Material Surfaces
2. Low Energy Electron Diffraction
3. X-ray Photoelectron Spectroscopy
4. Auger Electron Spectroscopy
5. Low Energy Ion Scattering
6. Secondary Ion Mass Spectroscopy
7. Vibrational Spectroscopy
8. Scanning Probe Microscopy
9. Thermal Analysis
10. Chromatography
11. Electron Microscopy
12. X-ray DiffractionThe purpose of this course is to introduce a series of material analysis methods to students. The content of this course includes surface analysis techniques, X-ray diffraction methods, thermal analysis tools, chromatography, and analytical electron microscopes.
1. Structure of Material Surfaces
2. Low Energy Electron Diffraction
3. X-ray Photoelectron Spectroscopy
4. Auger Electron Spectroscopy
5. Low Energy Ion Scattering
6. Secondary Ion Mass Spectroscopy
7.Vibrational Spectroscopy
8. Scanning Probe Microscopy
9.Thermal Analysis
10. Chromatography
11. Electron Microscopy
12.X-ray Diffraction
The purpose of this course is to introduce a series of material analysis methods to students. The content of this course includes surface analysis techniques, X-ray diffraction methods, thermal analysis tools, chromatography, and analytical electron microscopes.
The purpose of this course is to introduce a series of material analysis methods to students. The content of this course includes surface analysis techniques, X-ray diffraction methods, thermal analysis tools, chromatography, and analytical electron microscopes.
Textbook:
J. C. Vickerman and I. S. Gilmore, Surface Analysis-The Principal Techniques, 2nd edition, John Wiley & Sons, 2009.
References:
1. D.J. O’Connor, B.A. Sexton, and R.St.C. Smart edited, Surface Analysis Methods in Materials Science, Springer, 1992.
2. P.G. Merli and M.V. Antisari edited, Electron Microscopy in Materials Science, World Scientific, 1992.
3. B.D. Cullity, Elements of X-ray Diffraction, 2nd Edition, Addison-Wesley, 1978.
4. 吳泰伯等, 材料分析儀器, 精密儀器發展中心, 1998.
5. 汪建民編, 材料分析, 中國材料科學學會, 1998.
Textbook:
J. C. Vickerman and I. S. Gilmore, Surface Analysis-The Principal Techniques, 2nd edition, John Wiley & Sons, 2009.
References:
1. D.J. O’Connor, B.A. Sexton, and R.St.C. Smart edited, Surface Analysis Methods in Materials Science, Springer, 1992.
2. P.G. Merli and M.V. Antisari edited, Electron Microscopy in Materials Science, World Scientific, 1992.
3. B.D. Cullity, Elements of X-ray Diffraction, 2nd Edition, Addison-Wesley, 1978.
4. Wu Taibo et al., Material Analysis Instruments, Precision Instrument Development Center, 1998.
5. Wang Jianmin (ed.), Materials Analysis, Chinese Society for Materials Science, 1998.
| 評分項目 Grading Method | 配分比例 Grading percentage | 說明 Description |
|---|---|---|
| AttendanceAttendance attendance |
5 | |
| PresentationPresentation presentation |
30 | |
| Term PaperTerm Paper term paper |
15 | |
| ExamExam exam |
50 |
