0822 - 材料:材料分析

Materials Characterization

教育目標 Course Target

The purpose of this course is to introduce a series of material analysis methods to students. The content of this course includes surface analysis techniques, X-ray diffraction methods, thermal analysis tools, chromatography, and analytical electron microscopes.
1. Structure of Material Surfaces
2. Low Energy Electron Diffraction
3. X-ray Photoelectron Spectroscopy
4. Auger Electron Spectroscopy
5. Low Energy Ion Scattering
6. Secondary Ion Mass Spectroscopy
7. Vibrational Spectroscopy
8. Scanning Probe Microscopy
9. Thermal Analysis
10. Chromatography
11. Electron Microscopy
12. X-ray Diffraction

The purpose of this course is to introduce a series of material analysis methods to students. The content of this course includes surface analysis techniques, X-ray diffraction methods, thermal analysis tools, chromatography, and analytical electron microscopes.
1. Structure of Material Surfaces
2. Low Energy Electron Diffraction
3. X-ray Photoelectron Spectroscopy
4. Auger Electron Spectroscopy
5. Low Energy Ion Scattering
6. Secondary Ion Mass Spectroscopy
7. Vibrational Spectroscopy
8. Scanning Probe Microscopy
9. Thermal Analysis
10. Chromatography
11. Electron Microscopy
12. X-ray Diffraction

課程概述 Course Description

The purpose of this course is to introduce a series of material analysis methods to students. The content of this course includes surface analysis techniques, X-ray diffraction methods, thermal analysis tools, chromatography, and analytical electron microscopes.

The purpose of this course is to introduce a series of material analysis methods to students. The content of this course includes surface analysis techniques, X-ray diffraction methods, thermal analysis tools, chromatography, and analytical electron microscopes.

參考書目 Reference Books

Textbook:
J. C. Vickerman and I. S. Gilmore, Surface Analysis-The Principal Techniques, 2nd edition, John Wiley & Sons, 2009.

References:
1. D.J. O’Connor, B.A. Sexton, and R.St.C. Smart edited, Surface Analysis Methods in Materials Science, Springer, 1992.
2. P.G. Merli and M.V. Antisari edited, Electron Microscopy in Materials Science, World Scientific, 1992.
3. B.D. Cullity, Elements of X-ray Diffraction, 2nd Edition, Addison-Wesley, 1978.
4. 吳泰伯等, 材料分析儀器, 精密儀器發展中心, 1998.
5. 汪建民編, 材料分析, 中國材料科學學會, 1998.

Textbook:
J. C. Vickerman and I. S. Gilmore, Surface Analysis-The Principal Techniques, 2nd edition, John Wiley & Sons, 2009.

References:
1. D.J. O’Connor, B.A. Sexton, and R.St.C. Smart edited, Surface Analysis Methods in Materials Science, Springer, 1992.
2. P.G. Merli and M.V. Antisari edited, Electron Microscopy in Materials Science, World Scientific, 1992.
3. B.D. Cullity, Elements of X-ray Diffraction, 2nd Edition, Addison-Wesley, 1978.
4. Wu Taibo et al., Material Analyzer, Precision Device Development Center, 1998.
5. Editorial by Wang Jianmin, Material Analysis, Chinese Society for Materials Science, 1998.

評分方式 Grading

評分項目
Grading Method
配分比例
Percentage
說明
Description
Attendance
Attendance
5
Presentation
Presentation
30
Term Paper
Term Paper
15
Exam
Exam
50

授課大綱 Course Plan

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課程資訊 Course Information

基本資料 Basic Information

  • 課程代碼 Course Code: 0822
  • 學分 Credit: 0-3
  • 上課時間 Course Time:
    Tuesday/3,4[AG101] Friday/4[H103]
  • 授課教師 Teacher:
    何志松
  • 修課班級 Class:
    化材系3,4
選課狀態 Enrollment Status

目前選課人數 Current Enrollment: 52 人

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