1245 - 超大型積體電路測試 英授 Taught in English

教育目標 Course Target

With aims at assisting students to plan and to execute their experiments of SOCs, we describe characterization procedures and relevant tools. VLSI chips for evaluation, analysis and improvement techniques are introduced.

With aims at assisting students to plan and to execute their experiments of SOCs, we describe characterization procedures and relevant tools. VLSI chips for evaluation, analysis and improvement techniques are introduced.

課程概述 Course Description

With aims at assisting students to plan and to execute their experiments of SOCs, we describe characterization procedures and relevant tools. VLSI chips for evaluation, analysis and improvement techniques are introduced.

With aims at assisting students to plan and to execute their experiments of SOCs, we describe characterization procedures and relevant tools. VLSI chips for evaluation, analysis and improvement techniques are introduced.

參考書目 Reference Books

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, M. Bushnell and V. Agrawal, Kluwer Academic Publishers, 2000. and Lecture Notes

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, M. Bushnell and V. Agrawal, Kluwer Academic Publishers, 2000. and Lecture Notes

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選修-5783
電機系3,4,碩1,2 黃宇中 三/6,7,8 0-3 詳細資訊 Details

課程資訊 Course Information

基本資料 Basic Information

  • 課程代碼 Course Code: 1245
  • 學分 Credit: 0-3
  • 上課時間 Course Time:
    Tuesday/6,7,Thursday/6[HT101]
  • 授課教師 Teacher:
    黃宇中
  • 修課班級 Class:
    電機系3
選課狀態 Enrollment Status

目前選課人數 Current Enrollment: 0 人

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