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course information of 102 - 02 | 1245 (超大型積體電路測試)

Taught In English1245 - 超大型積體電路測試


教育目標 Course Target

With aims at assisting students to plan and to execute their experiments of SOCs, we describe characterization procedures and relevant tools. VLSI chips for evaluation, analysis and improvement techniques are introduced.With aims at assisting students to plan and to execute their experiments of SOCs, we describe characterization procedures and relevant tools. VLSI chips for evaluation, analysis and improvement techniques are introduced.


課程概述 Course Description

With aims at assisting students to plan and to execute their experiments of SOCs, we describe characterization procedures and relevant tools. VLSI chips for evaluation, analysis and improvement techniques are introduced.
With aims at assisting students to plan and to execute their experiments of SOCs, we describe characterization procedures and relevant tools. VLSI chips for evaluation, analysis and improvement techniques are introduced.


參考書目 Reference Books

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, M. Bushnell and V. Agrawal, Kluwer Academic Publishers, 2000. and Lecture Notes
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, M. Bushnell and V. Agrawal, Kluwer Academic Publishers, 2000. and Lecture Notes


評分方式 Grading

評分項目 Grading Method 配分比例 Grading percentage 說明 Description

授課大綱 Course Plan

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相似課程 Related Course

選修-5783 VLSI Test / 超大型積體電路測試 (電機系3,4,碩1,2,授課教師:黃宇中,三/6,7,8)

Course Information

Description

學分 Credit:0-3
上課時間 Course Time:Tuesday/6,7,Thursday/6[HT101]
授課教師 Teacher:黃宇中
修課班級 Class:電機系3
選課備註 Memo:
This Course is taught In English 授課大綱 Course Plan: Open

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